Electronics

IEC 63581-1 ED1 - Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects
Categories: Semiconductor devices
Committee: TC 47 (error)
Origin: IEC
Close date: 02 Jan 2026
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IEC 60297-3-103 ED2 - Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482,6 mm (19 in) series - Part 3-103: Keying and alignment pin
Categories: Mechanical structures for electronic equipment
Committee: TC 48/SC 48D (error)
Origin: IEC
Close date: 09 Jan 2026
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prEN IEC 63203-401-1:2025 - Wearable electronic devices and technologies - Part 401-1: Devices and systems: Functional elements - Measurement method of the stretchable resistive strain sensor
Categories: Electronic components. General
Committee: CLC/SR 124 (Wearable Electronic Devices and Technologies)
Origin: CENELEC
Close date: 30 Jan 2026
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IEC 63203-401-1 ED2 - Wearable electronic devices and technologies - Part 401-1: Devices and systems: functional elements - Measurement method of the stretchable resistive strain sensor
Categories: Electronic components. General
Committee: TC 124 (error)
Origin: IEC
Close date: 30 Jan 2026
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IEC 61837-2/AMD2 ED3 - Amendment 2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
Categories: Piezoelectric devices
Committee: TC 49 (error)
Origin: IEC
Close date: 30 Jan 2026
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IEC 60115-8-10 ED1 - Fixed resistors for use in electronic equipment - Part 8-10: Blank detail specification: Surface mount (SMD) low-power film resistors for assembly on circuit boards, for general electronic equipment, classification level G
Categories: Resistors
Committee: TC 40 (error)
Origin: IEC
Close date: 30 Jan 2026
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EN IEC 61837-2:2018/prA2:2025 - Amendment 2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
Categories: Piezoelectric devices
Committee: CLC/SR 49 (Piezoelectric and dielectric devices for frequency control and selection)
Origin: CENELEC
Close date: 30 Jan 2026
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prEN IEC 60115-8-10:2025 - Fixed resistors for use in electronic equipment - Part 8-10: Blank detail specification: Surface mount (SMD) low-power film resistors for assembly on circuit boards, for general electronic equipment, classification level G
Categories: Resistors
Committee: CLC/TC 40XB (Resistors)
Origin: CENELEC
Close date: 30 Jan 2026
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IEC 63567-1 ED1 - Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
Categories: Semiconductor devices
Committee: TC 47 (error)
Origin: IEC
Close date: 13 Feb 2026
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prEN IEC 63567-1:2025 - Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
Categories: Semiconductor devices
Committee: CLC/TC 47X (error)
Origin: CENELEC
Close date: 13 Feb 2026
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prEN IEC 61189-3-720:2025 - Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-720: Test methods for interconnection structures (circuit boards) - Transmission loss test method for high frequency multilayer circuit boards
Categories: Printed circuits and boards
Committee: CLC/SR 91 (Electronics assembly technology)
Origin: CENELEC
Close date: 20 Feb 2026
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